Scanning tunneling microscope measurements of the amplitude of vibration of a quartz crystal oscillator
نویسندگان
چکیده
We report highly accurate measurements of the vibrational amplitude of a transverse shear mode quartz resonator, obtained by directly imaging the surface oscillatory motion with a scanning tunneling microscope. Amplitude measurements, performed over a range of resonator drive levels and quality factors, agree with theoretical predictions to within a factor of two. © 2000 American Institute of Physics. @S0021-8979~00!04419-4#
منابع مشابه
Interface circuits for quartz crystal sensors in scanning probe microscopy applications
Complementary to industrial cantilever based force sensors in scanning probe microscopy SPM , symmetrical quartz crystal resonators QCRs , e.g., tuning fork, trident tuning fork, and needle quartz sensors, are of great interest. A self-excitation scheme with QCR is particularly promising and allows the development of cheap SPM heads with excellent characteristics. We have developed a high perfo...
متن کاملComparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most atomic force microscopes use micromachined force sensors made from silicon, but piezoelectric quartz sensors are being applied at an increasing rate, mainly in vacuum. These self-sensing force sensors allow a relatively easy upgrade of a scanning tunneling microscope to a combined scanning tunneling/atom...
متن کاملScanning force microscopy in the dynamic mode using microfabricated capacitive sensors
We report on the first successful operation of a scanning force microscope using microfabricated capacitive force sensors. The sensors, which are made from single crystal silicon on insulator wafers, consist of a cantilever spring with integrated tip at the free end and an electrically insulated counter electrode. Dynamic force gradient sensing is the preferred operating mode. Here, tip– sample...
متن کاملFrequency-tunable micromechanical oscillator
An experimental method, employing a scanning tunneling microscope ~STM! as an actuator and a scanning electron microscope ~SEM! as a motion detector, was developed to study microelectromechanical systems ~MEMS! and has been applied to study microfabricated cantilever beams. Vibrations actuated by an ac voltage applied to the piezodrive are transferred to the sample by the STM tip, which also pr...
متن کاملElectron backscatter diffraction (EBSD) in the SEM: applications to microstructures in minerals and rocks and recent technological advancements
Electron backscatter diffraction (EBSD) is based on the principle that a beam of electrons generated in the scanning electron microscope (SEM) is the source of randomly scattered electrons in a specimen. The backscattered electrons (BSE) that escape the sample generate a Kikuchi pattern on a phosphor screen, which is linked to the specimen crystal structure. Different crystal orientations gener...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2000